FinFET/GAA Modeling for IC Simulation and Design
-10%
portes grátis
FinFET/GAA Modeling for IC Simulation and Design
Using the BSIM-CMG Standard
Hu, Chenming; Lu, Darsen; Vanugopalan, Sriramkumar; Khandelwal, Sourabh; Duarte, Juan Pablo; Dasgupta, Avirup; Chauhan, Yogesh Singh; Payvadosi, Navid; Niknejad, Ali; Pahwa, Girish
Elsevier Science & Technology
05/2024
352
Mole
Inglês
9780323957298
Pré-lançamento - envio 15 a 20 dias após a sua edição
Descrição não disponível.
1. Gate-All-Around FET model
2. Cryogenic Temperature Model
3. FinFET- from Device Concept to Standard Compact Model
4. Analog/RF behavior of FinFET
5. Core Model for FinFETs
6. Channel Current and Real Device Effects
7. Leakage Current Models
8. Charge, Capacitance and Nonquasi-Static Effect
9. Parasitic Resistances and Capacitances
10. Noise
11. Junction Diode Current and Capacitance
12. Benchmark tests for Compact Models
13. BSIM-CMG Model Parameter Extraction
14. Temperature Effects
2. Cryogenic Temperature Model
3. FinFET- from Device Concept to Standard Compact Model
4. Analog/RF behavior of FinFET
5. Core Model for FinFETs
6. Channel Current and Real Device Effects
7. Leakage Current Models
8. Charge, Capacitance and Nonquasi-Static Effect
9. Parasitic Resistances and Capacitances
10. Noise
11. Junction Diode Current and Capacitance
12. Benchmark tests for Compact Models
13. BSIM-CMG Model Parameter Extraction
14. Temperature Effects
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
FinFET; GAA; BSIM-CMG; cryogenic modeling
1. Gate-All-Around FET model
2. Cryogenic Temperature Model
3. FinFET- from Device Concept to Standard Compact Model
4. Analog/RF behavior of FinFET
5. Core Model for FinFETs
6. Channel Current and Real Device Effects
7. Leakage Current Models
8. Charge, Capacitance and Nonquasi-Static Effect
9. Parasitic Resistances and Capacitances
10. Noise
11. Junction Diode Current and Capacitance
12. Benchmark tests for Compact Models
13. BSIM-CMG Model Parameter Extraction
14. Temperature Effects
2. Cryogenic Temperature Model
3. FinFET- from Device Concept to Standard Compact Model
4. Analog/RF behavior of FinFET
5. Core Model for FinFETs
6. Channel Current and Real Device Effects
7. Leakage Current Models
8. Charge, Capacitance and Nonquasi-Static Effect
9. Parasitic Resistances and Capacitances
10. Noise
11. Junction Diode Current and Capacitance
12. Benchmark tests for Compact Models
13. BSIM-CMG Model Parameter Extraction
14. Temperature Effects
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
