Handbook of Modern Coating Technologies
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Handbook of Modern Coating Technologies
Advanced Characterization Methods
Aliofkhazraei, Mahmood; Nasar, Ali; De Hosson, Jeff Th.M.; Chipara, Mircea; Bensaada Laidani, Nadhira
Elsevier Science & Technology
03/2021
500
Dura
Inglês
9780444632395
15 a 20 dias
1140
Descrição não disponível.
1. Application of the scanning vibrating electrode technique to the characterization of coatings
2. Spectroscopic ellipsometry
3. X-Ray Diffraction (XRD)
4. Neutron reflectivity for the investigation of coatings and functional layers
5. Application of micro- and nanoprobes to the analysis of small-sized 2D...
6. Application of fluorescence technique for understanding film
7. Stress in PVD thin films: Measurement methods and selected examples
8. Spatially-resolved electrochemical tools: Micro-potentiometry and SVET to detail localized corrosion problems in coated parts
2. Spectroscopic ellipsometry
3. X-Ray Diffraction (XRD)
4. Neutron reflectivity for the investigation of coatings and functional layers
5. Application of micro- and nanoprobes to the analysis of small-sized 2D...
6. Application of fluorescence technique for understanding film
7. Stress in PVD thin films: Measurement methods and selected examples
8. Spatially-resolved electrochemical tools: Micro-potentiometry and SVET to detail localized corrosion problems in coated parts
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Coating applications; Coating defects; Coating pores; Coatings; Component; Composite films; Composites; Corrosion; Electrochemical techniques; Electrochemistry; Energetic bombardment; Film formation; Fluorescence; Graphene; Healing; In situ; Inhibitors; Intrinsic stress; Latex films; Layered structure; Magnetic sensitivity; Micro- and nanoprobes; Microbeam; Microelectrodes; Microstrain; Microstructure; Nanocomposite; Nanoobject; Nanostructured thin films; Neutron; Optical properties; PMMA; PS; Polarized light; Polymer latex; Positron and microwave microscopy; Potentiometry; Pyrene; Reflection; Refraction; Residual stresses; SIET; SVET; Scanning vibrating electrode technique; Shallow depth; Spectroscopic ellipsometry; Stress gradients; Stress models; Thickness; Thin film growth; Thin films; Ultraviolet (UV)-visible spectroscopy; Void closure; Wafer curvature; Wavelength; X-ray diffraction; X-rays
1. Application of the scanning vibrating electrode technique to the characterization of coatings
2. Spectroscopic ellipsometry
3. X-Ray Diffraction (XRD)
4. Neutron reflectivity for the investigation of coatings and functional layers
5. Application of micro- and nanoprobes to the analysis of small-sized 2D...
6. Application of fluorescence technique for understanding film
7. Stress in PVD thin films: Measurement methods and selected examples
8. Spatially-resolved electrochemical tools: Micro-potentiometry and SVET to detail localized corrosion problems in coated parts
2. Spectroscopic ellipsometry
3. X-Ray Diffraction (XRD)
4. Neutron reflectivity for the investigation of coatings and functional layers
5. Application of micro- and nanoprobes to the analysis of small-sized 2D...
6. Application of fluorescence technique for understanding film
7. Stress in PVD thin films: Measurement methods and selected examples
8. Spatially-resolved electrochemical tools: Micro-potentiometry and SVET to detail localized corrosion problems in coated parts
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Coating applications; Coating defects; Coating pores; Coatings; Component; Composite films; Composites; Corrosion; Electrochemical techniques; Electrochemistry; Energetic bombardment; Film formation; Fluorescence; Graphene; Healing; In situ; Inhibitors; Intrinsic stress; Latex films; Layered structure; Magnetic sensitivity; Micro- and nanoprobes; Microbeam; Microelectrodes; Microstrain; Microstructure; Nanocomposite; Nanoobject; Nanostructured thin films; Neutron; Optical properties; PMMA; PS; Polarized light; Polymer latex; Positron and microwave microscopy; Potentiometry; Pyrene; Reflection; Refraction; Residual stresses; SIET; SVET; Scanning vibrating electrode technique; Shallow depth; Spectroscopic ellipsometry; Stress gradients; Stress models; Thickness; Thin film growth; Thin films; Ultraviolet (UV)-visible spectroscopy; Void closure; Wafer curvature; Wavelength; X-ray diffraction; X-rays