Sensors, Circuits, and Systems for Scientific Instruments

Sensors, Circuits, and Systems for Scientific Instruments

Fundamentals and Front-Ends

Mandal, Soumyajit

Elsevier Science & Technology

04/2025

700

Mole

9780323950664

Pré-lançamento - envio 15 a 20 dias após a sua edição

Descrição não disponível.
Section 1: Fundamentals
1 Review of Linear Systems
2 General Properties of Measurement Systems

Section 2: Devices
3 Review of Semiconductor Device Physics
4 Models of Electronic Devices
5 Sensors and Actuators
6 Models of Sensors and Actuators
7 Noise in Devices

Section 3: Circuits
8 Noise in Circuits
9 Low-Noise Front-End Design
10 Precision Circuit Techniques
11 High-Power Front-End Design
12 Oscillators and Frequency References
13 Digitization

Section 4: Signals and Data Processing
14 Review of Digital Signal Processing
15 Embedded Processing
16 Optimal Filtering and Signal Detection
17 Pattern Recognition and Machine Learning

Section 5: System Design and Integration
18 System-Level Design and Simulation
19 System Integration and Deployment

Section 6: Applications
20 Measurements in Extreme Environments
21 Medical Imaging: MRI
22 Medical Imaging: Ultrasound
23 Radio Astronomy
24 High-Energy Physics
25 Detection of Gravitational Waves
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Adler's equation; Allan deviation; all-digital PLLs; antenna noise models; Barkhausen criterion; bipolar junction transistors (BJTs); blackbody spectrum; capacitors; capture and lock range; Clocks; delay-locked loops (DLLs); describing function analysis; diodes; direct digital synthesis (DDS); electrical oscillators; electromechanical oscillators; field-effect transistors (FETs); flicker noise; fluctuation dissipation theorem (FDT); frequency counters; frequency stability; frequency synthesizers; Friis formula; GPS-disciplined oscillators (GPSDOs); inductors; injection locking; input impedance matching; international system of units (SI); JFETs; jitter; low-frequency noise; MOSFETs; noise matching; noise models; oscillator ageing; phase detectors; phase noise; Phase-locked loops (PLLs); Resistors; shot noise; spectrum analyzers; Temperature; thermal noise; thermodynamics; transformers; voltage-controlled oscillators (VCOs);