Non-Destructive Material Characterization Methods

1. Introduction to Non-Destructive Material Characterizations 2. Optical Microscope (Interferometric and non- interferometric optical microscope techniques) 3. Polarized Microscope 4. Atomic Force Microscopy 5. Non-Destructive Imaging of Buried Interfaces Using Decelerated Electron-Beam in Scanning Electron Microscopy 6. Scanning Probe Microscope 7. Transmission Electron Microscope 8. Neutron Imaging 9. Infrared Thermography: Philosophy, Approaches, Analysis - Processing, and Guidelines 10. Non-Destructive Material Testing in Welding: Ultrasonic Scanning 11. Diffraction with X -Rays and Neutrons 12. Raman Spectroscopy - Part 1 13. Raman Spectroscopy - Part 2 14. UV-Vis Spectroscopy in Non-Destructive Testing 15. Hard X-ray Photoelectron Spectroscopy (HAXPES) and X-Ray Diffraction Techniques (XRD): Non-Destructive compositional, electronic, chemical and structural in-depth characterization in the tens-of-nanometer scale 16. X-ray Fluorescence Spectroscopy 17. Mass Spectrometry 18. Atomic Absorption Spectrophotometry 19. Dielectric Spectroscopy and Techniques 20. Element Analysis with Neutrons 21. X-ray Stress Analysis 22. Neutrons - Characteristics and Sources 23. NDT of Steel Components based upon their Magnetic Answer 24. Cloud-Based Non-Destructive Characterization 25. Complementary Results of Non-Destructive Elemental Assay and Liberation Analysis of Waste Printed Circuit Boards 26. Future Perspectives on Non-Destructive Material Characterization Methods towards Sustainability and Circular Economy

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• Química analítica

?Amplifier; Analytical chemistry; Analytical method; Analytical techniques; Atomic absorption spectrophotometry; Atomic force microscope; Atomic force microscopy; Backscattered electrons; Birefringence; CVAAS; Catalyst analysis; Characterization; Chemical mixture; Chemometrics; Condensor; Dielectric spectroscopy; Dielectrics; Diffraction; Drug analysis; E-waste; ETAAS; Eddy current testing; Electrical and electronic equipment; Electromagnetic; Electromagnetic waves; Electron acceleration; Electron beam; Electrons; Elemental analysis; Elemental mapping; Energy conversion systems; Engineering; Environmental analysis; Environmental toxicology; Examples of inspections; FAAS; Field measurements; Food analysis; GFAAS; Geochemistry; HGAAS; Hard X-ray photoelectron spectroscopy; Hardness treatement; Hendheld XRF; ISO 17640; Imaging; In situ measurements; In-situ monitoring; Industrial analysis; Infrared thermography (IRT); Instrumentation; Interaction force measurements; Internal stress; Lattice strain; Liquid crystals; Macro x-ray fluorescence (MA-XRF); Magnetic Barkhausen noise; Magnetic incremental permeability; Magnetization mechanisms; Material evaluation; Materials application; Materials characterization; Materials chemistry; Materials in biotechnology; Materials structure; Medical biochemistry; Mesoscale; Micro-electromechanical systems; Microscopes; Microwave; Monochromator; Neutron; Neutron activation analysis; Neutron characteristics; Neutron imaging; Neutron sources; Neutron-based analytical methods; Neutrons; Non-destructive depth profile; Nondestructive; Nondestructive analysis; Nondestructive testing; Nondestructive testing (NDT); Noninvasive testing; Numerical aperture; Numerical modeling; Objective lens; Optical crystallography; Optical interferometric techniques; Optical non-interferometric techniques; Optical properties; Phase demodulation algorithms; Phased array ultrasonic testing (PAUT); Polarized microscopy; Polycrystalline; Polymeric fibers; Portable XRF; Printed circuit boards; Prompt gamma activation analysis; Raman imaging